Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Electron Microscopy Sciences Crossed Scale Microscope Graticle NE 72, 26 mm, 20 mm with 200 divisions of 0.1 mm
Used as a horizontal and a vertical scale, they are especially useful when interested in measurement in different axis. NE 72 Crossed Micrometer scale.
Size: 26 mm
Divisions: 20 mm with 200 divisions of 0.1 mm
Electron Microscopy Sciences Gilder Hexagonal 300 mesh Nickel Grid
A reliable support specimen grid source. Features: well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected. The copper grids with palladium plating offers better grid strength and avoids tarnishing. 3.05 mm diameter, 0.7 mil (18um) thickness.
Grid: Nickel
Pitch: 83 µm
Hole: 58 µm
Bar: 25 µm
Electron Microscopy Sciences Chalkley Point Array Graticle NG52, 21mm
Eyepiece graticle is used to quickly determine the relationship of components to each other using random sampling. Curtis gives an example of its application, where a researcher may want to see whether or not a certain drug affects the volume proportion of cell types in a given organ. With this graticule the proportion of points lying over the image of one type of component is statistically proportional to the area occupied by that component. The 25 points of the array are placed over the field of view at random, so that a comparison can be made between the number of points touching the one type of component, with number touching the other type of component in each viewing. A series of observations will yield an increasingly accurate ratio of the comparative incidence of each type of particle.
Size: 21 mm
Electron Microscopy Sciences Double Neubauer Ruled Hemacytometer Chamber Only (3510)
Double improved Neubauer rulings are diamond etched directly into a polished recess to reduce damage from scratches. Opaque surfaces above and below the counting area offer an easy focal reference. The chamber comes with a quick orientation mark for the microscope. 0.1 mm cell depth.
Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-MH-4C, 400 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis.
Mesh: 400
Material: Copper
Electron Microscopy Sciences EMS Gold Aperture with 50 µm hole, 3 mm O.D., 0.24 mm thick
Advanced techniques of thin metal film application permits the apertures to retain a clean hole edge during prolonged beam exposure. Ultra-thin, half-micron design discourages contaminant accumulation and stabilizes astigmatic conditions to provide longer life. Conventional mechanical cleaning involving costly down-time is no longer necessary. Because the foil is ultra thin, care must be taken when handling the gold foil apertures.
Size: 50 µm
O.D.: 3 mm
Thickness: 0.24 mm
Electron Microscopy Sciences EMS Gold Aperture with 15 µm hole, 3 mm O.D., 0.24 mm thick
Advanced techniques of thin metal film application permits the apertures to retain a clean hole edge during prolonged beam exposure. Ultra-thin, half-micron design discourages contaminant accumulation and stabilizes astigmatic conditions to provide longer life. Conventional mechanical cleaning involving costly down-time is no longer necessary. Because the foil is ultra thin, care must be taken when handling the gold foil apertures.
Size: 15 µm
O.D.: 3 mm
Thickness: 0.24 mm
Electron Microscopy Sciences ProScope C-Mount Adapter
Use your own optics with our industry standard 25.4mm c-mount adapter. Attach the ProScope to an existing microscope, telescope or camera lenses to capture digital images and expand your digital imaging tools.
Electron Microscopy Sciences TEM Screen Recoating Siemens Outer, Crescent, Outer Field
For optimum viewing, fluorescent screens should be recoated regularly. Viewing screens are easily damaged by the electron beam, especially at high accelerating voltages where knock-on damage can be severe. A proprietary process where 1 to 2 micron particles of phosphor are deposited on the screen and produce the highest possible resolution.
Electron Microscopy Sciences Formvar Support Film 5-6 nm thick on 2 X 1 mm Slot Grid Copper Grid
A thin film of pure formvar resin coats the shiny side of a slotted grid. Coated grids are optically checked and batch tested in the electron microscope. Packed in grid storage box. Standard coating is 5 to 6 nm thick.
Grid: Copper
Electron Microscopy Sciences Walton & Beckett Graticule G25, 19 mm,
The Walton and Beckett graticule is for counting fibrous dust (asbestos or glass fibers) and particularly where the majority of fibers to be counted are shorter than 5 microns. The circle is divided into four by two diametrical lines scaled in units of 5 and 3 microns respectively. 3 and 5 microns are the critical measurements of fiber lengths and diameters used in fiber counting. Walton and Beckett include shapes with an aspect ratio of 3:1 or 5:1 for comparing to fibers.
IMPORTANT NOTE: The circle on these Walton & Beckett graticules must represent 100 microns at the stage and each one must be manufactured to the individual instrument. Based on the G22. The G25 is produced by the Institute of Occupational Health.
Size: 19 mm
Electron Microscopy Sciences EMS Morphology Stage Micrometer Model IAM-1, T/L, Calibrated
Ideally for morphological calibration where two dimensional shapes have to be measured precisely. Standard includes a set of eight test plates of various shapes, positions, angles and sizes. It also includes a linear measurement scale for calibrating your imaging system. Overall size: 1" x 3" (25 mm x 75 mm). Positive image / Chrome on glass (PG) Calibrated.
Electron Microscopy Sciences TEM Screen Recoating Zeiss EM9 Large and Small Combination
For optimum viewing, fluorescent screens should be recoated regularly. Viewing screens are easily damaged by the electron beam, especially at high accelerating voltages where knock-on damage can be severe. A proprietary process where 1 to 2 micron particles of phosphor are deposited on the screen and produce the highest possible resolution.
Electron Microscopy Sciences Crossed Gauge Lines Microscope Graticule NE 54, Custom
Use as crossed lines, but for the measuring of distances between thelines. Greater accuracy can be obtained by locatng the specimen detail between the graticules gauge pair.
Size: Custom
Divisions: Two vertical lines 0.2 mm apart
Electron Microscopy Sciences Shorter Pin SEM Stub Slotted 2" Head, 6 mm Pin, Aluminum, 3.2 mm Pin diameter
SEM specimen mount with shorter pin and slotted head for use with all Zeiss/LEO SEM, FESEM & FIB systems. Made from ultra-pure aluminum with a standard lathe finish.
Head: 2"
Pin height: 6 mm
Pin diameter: 3.2 mm